Description

SciAps X-50 XRF Analyzer

Original – SciAps X-50 XRF Analyzer

The SciAps X-50, most competitive portable X-Ray Fluorescence (XRF) analyzer, uses the proven, reliable and competitive technology of PiN diode detectors. For many applications such as basic sorting of stainless steel, refractories and copper alloys, or analyzing heavy metals in soils, ores, powders, gold, precious metals, etc., the PiN technology is perfectly suited. The X-50 allow to measure all the needed elements for currents applications. The X-50 presents a very attractive price for routine applications.

The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x – 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 100 eV less (greater width). However for many applications such as basic sorting of stainless, high temp and copper alloys, or analyze base or heavy metals in soils, ores, powders, etc. the PiN technology is satisfactory. The X-50 will NOT measure Mg, Al or Si, and in some materials can measure P and S at the 1% level. Limits of detection will be 5x higher (elevated) compared to SDD versions of the X. However the X-50 features an attractive price point for the applications that work well. The X-50 includes the same advanced X-ray tube as other X models (operating at 40 kV max.), integrated camera, video, and the Android OS platform. The X-50 is available for alloy, environmental, mining/exploration, industrial and user-customizable applications. Analyzers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user defined empirical calibrations.

Weight

3.3 lbs with battery

Dimensions

7.25″ x 10.5″ x 4.5″

Power

On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time).

Display

5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic.

Comms/Data Transfer

Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software.

Excitation Source

6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.

Detector

7mm2 PiN diode detector (active area), 190eV resolution FWHM at 5.95Mn K-alpha line.

X-Ray Filtering

6 position filter wheel for beam optimization.

Processing Electronics Host Processor

ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD

Pulse Processor

14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor Digital Filtering implemented in FPGA for high throughput pulse processing 50nS – 24uS peaking time

Calibration

Fundamental parameters. For Geochem and Env. Soil Apps, users may also choose “Compton Normalization” method and/ or use empirically derived calibrations.

Calibration Check

Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.

Environmental Temp. Range

10°F to 130°F at 25% duty cycle.

Security

Password protected usage (user level) and internal settings (admin).

Regulatory

CE, RoHS, USFDA registered, Canada RED Act.